3M™ Cleaning Film T-C2L, Sheet, 50 mm x NH, 10 Sheets/Case

3M™ Cleaning Film T-XX, Disc is used in semiconductor manufacturing fab. Probe card is an important part for testing availability of semiconductor chips formed on silicon wafer , and then chips are determined if no problem. High reliablity of probe card is critical for chip production yield, so the probe card must be cleaned by 3M™ Cleaning Film T-XX, laminated on dummy wafer. 3M™ Cleaning Film T-XX, can be easily used with specific size of dummy wafer.
Special Price $28.76 Regular Price $33.83
UPC 04549395362974
3M ID 7010602022
Packaging Case
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More Information
3M ID 7010602022
Global Product Hierarchy Abrasives > Abrasive Discs > Film Discs
Abrasive Material Aluminum Oxide
Grit Non Pertinent
Product Type simple
Quantity 0
Trademark 1 3M™
Country of Origin Japan
SAP Shelf Life In Days 1825
Base - Billing Unit EA
Base - Metric Gross Weight 22.0 G
Base - Item Quantity 1
Base - Unit EA
Shipper - Billing Unit EA
Shipper - Customary Cubic Dimension 289.9848319381678 ci
Shipper - Customary Gross Weight 0.48501697680673067 lbs
Shipper - Customary Net Weight 0.46076612796639416 lbs
Shipper - Customary Height Dimension 2.3622047244094486 in
Shipper - Customary Length Dimension 8.661417322834646 in
Shipper - Customary Width Dimension 14.173228346456693 in
Shipper - Metric Cubic Dimension 4752.0 CCM
Shipper - Metric Weight 220.0 G
Shipper - Metric Net Weight 209.0 G
Shipper - Metric Height Dimension 6.0 CM
Shipper - Metric Length Dimension 22.0 CM
Shipper - Metric Width Dimension 36.0 CM
Shipper - Item Quantity 10
Shipper - Unit CS
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